;鉑電阻溫度計，金屬的內(nei)部(bu)導電過程較(jiao)復雜(za)，其電阻率(lv)簡單的可由兩部(bu)分組成ρ=ρ1(T) ρr，ρ1(T)是由晶格(ge)格(ge)點的熱運(yun)動所引起(qi)，它與溫度有關，稱為聲子電阻率(lv)。

  《用(yong)于(yu)標(biao)(biao)準(zhun)(zhun)(zhun)(zhun)鉑(bo)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)溫(wen)(wen)度(du)(du)(du)計(ji)(ji)的(de)(de)固定點裝(zhuang)置(zhi)校準(zhun)(zhun)(zhun)(zhun)規(gui)(gui)范(fan)》本(ben)規(gui)(gui)范(fan)適用(yong)于(yu)－189.3442℃～961.78℃范(fan)圍中用(yong)于(yu)分度(du)(du)(du)高溫(wen)(wen)鉑(bo)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)溫(wen)(wen)度(du)(du)(du)計(ji)(ji)及標(biao)(biao)準(zhun)(zhun)(zhun)(zhun)鉑(bo)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)溫(wen)(wen)度(du)(du)(du)計(ji)(ji)的(de)(de)固定點裝(zhuang)置(zhi)的(de)(de)校準(zhun)(zhun)(zhun)(zhun)。該標(biao)(biao)準(zhun)(zhun)(zhun)(zhun)的(de)(de)起草參考了990《國際溫(wen)(wen)標(biao)(biao)宣貫手冊》、JJG160-1992《標(biao)(biao)準(zhun)(zhun)(zhun)(zhun)鉑(bo)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)溫(wen)(wen)度(du)(du)(du)計(ji)(ji)檢定規(gui)(gui)程(cheng)(cheng)》、JJG716-1991《0℃～419.527℃工(gong)作(zuo)基(ji)準(zhun)(zhun)(zhun)(zhun)鉑(bo)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)溫(wen)(wen)度(du)(du)(du)計(ji)(ji)檢定規(gui)(gui)程(cheng)(cheng)》、JJG859-1994《標(biao)(biao)準(zhun)(zhun)(zhun)(zhun)長桿鉑(bo)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)溫(wen)(wen)度(du)(du)(du)計(ji)(ji)檢定規(gui)(gui)程(cheng)(cheng)》、JJG985-2004《高溫(wen)(wen)鉑(bo)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)溫(wen)(wen)度(du)(du)(du)計(ji)(ji)工(gong)作(zuo)基(ji)準(zhun)(zhun)(zhun)(zhun)裝(zhuang)置(zhi)檢定規(gui)(gui)程(cheng)(cheng)》等文(wen)獻，是標(biao)(biao)準(zhun)(zhun)(zhun)(zhun)規(gui)(gui)范(fan)得(de)到更完善的(de)(de)建立(li)。

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